Semiconductor memory device for testifying over-driving...

Details Semiconductor memory device for testifying over-driving... Semiconductor memory device for testifying over-driving...

2006-05-02

2006-05-02

Nguyen, Tuan T. (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S189120, C365S230060

Reexamination Certificate

active

07038957

ABSTRACT:
A semiconductor memory device is capable of testifying over-driving quantity depending on position. A semiconductor memory device includes a plurality of in-bank over-drivers for temporarily applying a high voltage to a normal power that is supplied to a memory array cell within a bank; a plurality of out-bank over-drivers arranged outside the bank for temporarily applying the high voltage to the normal power that is supplied to the bank; a plurality of PERI over-drivers arranged at the peripheral area for temporarily applying the high voltage to the normal power; a mode register set for receiving a signal to select one of the over-drivers; and a decoder activated in response to a test mode signal for decoding the set value of the MRS to selectively drive the over-driver arranged at a desired position and having desired driving power among the in-bank and out-bank over-drivers and the PERI over-drivers.

REFERENCES:
patent: 5805854 (1998-09-01), Shigeeda
patent: 6347063 (2002-02-01), Dosaka et al.
patent: 6788616 (2004-09-01), Takahashi
patent: 2005/0007835 (2005-01-01), Lee et al.
patent: 2002-074961 (2002-03-01), None
patent: 2004-146046 (2004-05-01), None

Affiliated with

Also associated with

Rating

Semiconductor memory device for testifying over-driving... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor memory device for testifying over-driving..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor memory device for testifying over-driving... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3626471