Memory built in self test circuit and method for generating...

Details Memory built in self test circuit and method for generating... Memory built in self test circuit and method for generating...

2008-01-15

2008-01-15

Phung, Anh (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S200000, C365S189020, C714S718000, C714S733000

Reexamination Certificate

active

07319624

ABSTRACT:
A circuit and a method for performing a memory built in self test (MBIST) are provided. The circuit comprises a plurality of routing boxes and a test controller. The test controller provides test input signals to a plurality of embedded memory blocks, receives data output signals output by the memory blocks in response to the test input signals, and verifies the data output signal based on the test input signals. The routing boxes are placed to form a common bus between the test controller and the memory blocks to transmit the signals between the test controller and the memory blocks.

REFERENCES:
patent: 6243307 (2001-06-01), Kawagoe
patent: 6782498 (2004-08-01), Tanizaki et al.
patent: 7257752 (2007-08-01), Chen
patent: 7263010 (2007-08-01), Iwai et al.

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