Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2007-01-23
2007-01-23
Phung, Anh (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S063000
Reexamination Certificate
active
11230087
ABSTRACT:
Systems and methods are directed to verification of configuration data stored in memory cells. For example, in one embodiment, an integrated circuit includes a first plurality of memory cells including a first set of test memory cells. A second plurality of memory cells is adapted to receive and store data provided from the first plurality of memory cells. The second plurality of memory cells include a second set of test memory cells corresponding to the first set of test memory cells. A comparator is adapted to compare stored data from the second set of test memory cells with the data values of the first set of test memory cells. Control circuitry is responsive to the comparator to control whether additional data from the first plurality of memory cells is loaded to the second plurality of memory cells.
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Gong Kory
Wong Jack T.
Folsom Brent A.
Lattice Semiconductor Corporation
MacPherson Kwok & Chen & Heid LLP
Phung Anh
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