Apparatus for configuring a subset of an integrated circuit havi
Apparatus for configuring a subset of an integrated circuit havi
Apparatus for controlling test mode of semiconductor memory
Apparatus for dynamically repairing a semiconductor memory
Apparatus for dynamically repairing a semiconductor memory
Apparatus for generating address bit patterns for testing semico
Apparatus for implementing eFuse sense amplifier testing...
Apparatus for recognizing chip identification and...
Apparatus for testing redundant elements in a packaged semicondu
Apparatus for testing redundant elements in a packaged...
Apparatus for testing semiconductor memory
Apparatus for testing semiconductor memory device
Apparatus of repairing memory cell and method therefor
Apparatus, system and method for identifying semiconductor memor
Application of external voltage during array VT testing
Application specific event based semiconductor memory test...
Area-efficient memory built-in-self-test circuitry with...
Auto-precharge signal generating circuit
Automatic generation and validation of memory test models
Automatic test circuit for a semiconductor memory device capable