Apparatus for configuring a subset of an integrated circuit havi

Details Apparatus for configuring a subset of an integrated circuit havi Apparatus for configuring a subset of an integrated circuit havi

1995-06-23

1996-02-13

Nelms, David C.

Static information storage and retrieval

Read/write circuit

Testing

36518912, 365221, 36518508, 365154, 371 222, 371 223, G11C 2900

Patent

active

054916666

ABSTRACT:
An integrated circuit including a plurality of individual boundary scan circuits each associated with a separate portion of the circuitry of the integrated circuit. The registers of the individual boundary scan circuits are joined to provide a series boundary scan register chain in which individual portions of the circuitry included within the integrated circuit may be individually manipulated.

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Computing and Control Division Colloquium publication dated Nov. 7, 1986, entitled: New Ideas and Testing.
Computer-Aided Engineering Journal publication dated Aug. 1986, author: Colin Maunder, entitled: The Joint Test Action Group, pp. 121-122.
Fluke, Fluke and Philips--The Global Alliance in T&M entitled "The ABCs of Boundary-Scan Test", 1991, 99. 1-43.

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