Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2000-08-12
2001-10-09
Hoang, Huan (Department: 2818)
Static information storage and retrieval
Read/write circuit
Testing
C365S051000, C365S052000
Reexamination Certificate
active
06301167
ABSTRACT:
BACKGROUND OF THE INVENTION AND PRIOR ARTS
1. Field of the Invention
The present invention relates to an apparatus for testing a semiconductor memory, and in particular to an apparatus for testing a semiconductor memory which is capable of implementing an accurate operation state under a real mounting environment of a memory device by varying a voltage applied to a memory device which will be tested using a main board of a computer system such as a PC, a net station computer, a server computer, etc.
2. Description of the Background Art
Generally, in an apparatus using a semiconductor memory such as a SDRAM(Synchrous Dynamic Random Access Memory), a RAMBUS DRAM, or a SRAM(Static Random Access Memory), in order to check the characteristic or reliability of an interior circuit after an assembling operation of a device, an assembled device is mounted in a socket, and then the test is performed using a specific equipment for an expensive semiconductor memory test.
However, since the semiconductor memory test apparatus is expensive, the cost for a test of one memory device is increased. Therefore, the product competitive capacity of a company is decreased. In addition, since the memory device is tested using an additional apparatus, not under an actual environment, it is impossible to implement a desired use environment characteristic in a PC main board which is an actual environment for using a memory device.
In order to overcome the above problems, in a semiconductor device fabrication field, recently, a test method using a main board of a computer apparatus such as a PC, a work station or a server which actually uses a semiconductor device is generally used.
In the method using a main board of a computer apparatus, a socket is used for detachably installing a memory module or a unit semiconductor device on a main board. The memory module or unit memory device which will be tested is inserted into the socket, and then the computer apparatus is operated, so that it is possible to test whether the semiconductor device is defective or not.
However, in the above-described method, a voltage(for example, 3V) supplied from a power supply unit of a computer apparatus is directly supplied to a semiconductor memory device(module) which will be tested. The accuracy of the test is decreased under an actual operation environment. Namely, in the case that the voltage supplied thereto is changed, the result of the test may be changed.
SUMMARY OF THE INVENTION
Accordingly, it is an object of the present invention to provide an apparatus for testing a semiconductor memory which overcomes the problems encountered in the conventional art.
It is another object of the present invention to provide an apparatus for testing a semiconductor memory according to a first embodiment of the present invention which is capable of implementing an accurate operation state of an actual mounting environment of a semiconductor memory device by varying and supplying a certain voltage supplied from a power supply unit when testing whether a semiconductor memory device is defective or not using a main board of a computer apparatus.
To achieve the above objects, there is provided an apparatus for testing a semiconductor memory which includes a power control module for varying an output voltage of the power supply unit and supplying to the semiconductor memory in accordance with a power control signal from a CPU(Central Processing Unit) of the main board, and an interface unit for supplying the power control signal from the CPU of the main board to the power control module in an apparatus for testing a semiconductor memory capable of testing whether a semiconductor memory is defective by supplying a certain voltage supplied from a power supply unit to a semiconductor memory after mounting a semiconductor memory into a socket installed on a main board of a computer apparatus.
The power control module includes a power controller for adjusting an outpult voltage of the power supply unit to a certain range level and supplying to the semiconductor memory in accordance with a power control signal from the CPU of the main board, and an over current clamping unit connected between the power controller and the semiconductor memory for clamping an over current.
To achieve the above objects, there is provided an apparatus for testing a semiconductor memory according to a second embodiment of the present invention which includes a power control module for varying a certain voltage of the power supply unit and supplying to the semiconductor memory in accordance with a power control signal from a CPU(Central Processing Unit) of the main board, and an interface unit for supplying the power control signal from the CPU of the main board to the power control module in an apparatus for testing a semiconductor memory capable of testing whether a semiconductor memory is defective by supplying a certain voltage supplied from a power supply unit to a semiconductor memory after mounting a semiconductor memory into a socket installed on a main board of a computer apparatus.
The power control module includes a power controller for adjusting a certain voltage of the power supply unit to a certain range level and supplying to the semiconductor memory in accordance with a power control signal from the CPU of the main board, and an over current clamping unit connected between the power controller and the semiconductor memory for clamping an over current.
The interface unit is one of the types formed of an ISA slot type, a RS232 connector type, a parallel port type, a TCI type, and a USB type.
Additional advantages, objects and features of the invention will become more apparent from the description which follows.
REFERENCES:
patent: 4890224 (1989-12-01), Fredmont
patent: 6067649 (2000-05-01), Goodwin
Ham Byung Koo
Ham Byung Soo
Kim Jong Hyun
Lee Ill Young
Lee Sang Sik
Hoang Huan
Roth & Goldman
Silicon Tech Ltd.
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