Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2009-01-12
2010-06-08
Dinh, Son (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S205000, C365S203000, C365S225700
Reexamination Certificate
active
07733722
ABSTRACT:
Apparatus implements effective testing of a sense amplifier for an eFuse without having to program or blow the eFuse. After initial processing of the sense amplifier, testing determines whether the sense amplifier can generate a valid “0” and “1” before programming the eFuse. A first precharge device and a second precharge device that normally respectively precharge a true sense node and a complement sense node to a high voltage are driven separately. For testing, one of the precharge devices is conditionally held off to insure the sense amplifier results in a “0” and “1”. This allows the testing of the sense amplifier devices as well as down stream connected devices. Once testing is complete, both precharge devices are controlled in tandem.
REFERENCES:
patent: 7224633 (2007-05-01), Hovis et al.
patent: 2003/0125925 (2003-07-01), Walther et al.
patent: 2007/0157140 (2007-07-01), Holesovsky et al.
patent: 2007/0159231 (2007-07-01), Lin et al.
patent: 2007/0230079 (2007-10-01), Ashizawa
Aipperspach Anthony Gus
Allen David Howard
Bushard Louis Bernard
Paone Phil Christopher Felice
Uhlmann Gregory John
Dinh Son
International Business Machines - Corporation
Nguyen Nam
Pennington Joan
LandOfFree
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