Damascene resistor and method for measuring the width of same
DC electric field assisted anneal
Deep-trench capacitor with hemispherical grain silicon...
Defect-free junction formation using laser melt annealing of...
Defined sacrifical region via ion implantation for...
Deposition of dopant impurities and pulsed energy drive-in
Deposition of dopant impurities and pulsed energy drive-in
Deposition of titanium oxide film containing droping element...
Deuterium doping for hot carrier reliability improvement
Device improvement by source to drain resistance lowering throug
Device isolation structure of a semiconductor device and...
Diffusing dopants into a semiconductor wafer
Diffusion barrier for polysilicon gate electrode of MOS device i
Diffusion stop implants to suppress as punch-through in SiGe
Direct gas-phase doping of semiconductor wafers using an organic
Direct gas-phase doping of semiconductor wafers using an organic
Direct gas-phase doping of semiconductor wafers using an organic
Dopant activation anneal to achieve less dopant diffusion...
Dopant interface formation
Doped silicon deposition process in resistively heated...