DC electric field assisted anneal

Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S659000, C438S660000, C438S514000, C438S522000, C257S442000

Reexamination Certificate

active

06274465

ABSTRACT:

FIELD OF THE INVENTION
The present invention relates to a method and device for controlling the diffusion of dopants in a semiconductor substrate.
BACKGROUND OF THE INVENTION
As semiconductor device structure sizes shrink, greater and greater control must be excised to control the formation of the ever shrinking structures. The location and dimensions of the smaller and smaller structures require careful control to ensure proper placement. At the minute dimensions involved, small errors in misplacement and/or size of structures formed can result in non-functional or mis-functioning devices. Processes involved in semiconductor device manufacture require ever increasing levels of precision to create the desired structures.
SUMMARY OF THE INVENTION
The present invention concerns a method for forming a desired junction profile in a semiconductor device. At least one dopant is introduced into a semiconductor substrate. The at least one dopant is diffused in the semiconductor substrate through annealing the semiconductor substrate and the at least one dopant while simultaneously exposing the semiconductor substrate to a DC electric field.
The present invention also relates to a device for forming a desired junction profile in a semiconductor substrate. The device includes means for annealing a semiconductor substrate in which at least one dopant has been diffused. The annealing means includes at least one heat source. The device also includes means for producing a DC electric field and exposing the semiconductor substrate to the DC electric field simultaneous with the annealing.
Still other objects and advantages of the present invention will become readily apparent by those skilled in the art from the following detailed description, wherein it is shown and described only the preferred embodiments of the invention, simply by way of illustration of the best mode contemplated of carrying out the invention. As will be realized, the invention is capable of other and different embodiments, and its several details are capable of modifications in various obvious respects, without departing from the invention. Accordingly, the drawings and description are to be regarded as illustrative in nature and not as restrictive.


REFERENCES:
patent: 5290731 (1994-03-01), Sugano et al.
patent: 5343064 (1994-08-01), Spangler et al.
patent: 5407847 (1995-04-01), Hayden et al.
patent: 5412242 (1995-05-01), Cahen et al.
patent: 5508216 (1996-04-01), Inoue
patent: 5729094 (1998-03-01), Geis et al.
patent: 5757048 (1998-05-01), Inoue
patent: 5773337 (1998-06-01), Lee
patent: 5825066 (1998-10-01), Buynoski

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

DC electric field assisted anneal does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with DC electric field assisted anneal, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and DC electric field assisted anneal will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2512915

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.