Coating thickness measuring device

Coaxial charged particle energy analyzer

Cold chamber for the working objects for microscopic and electro

Cold trap for electron microscope

Collection of secondary electrons through the objective lens...

Collimator for high takeoff angle energy dispersive spectroscopy

Color synthesizing scanning electron microscope

Color-coded mapping system and method for identifying elements i

Column for charged particle beam device

Column simultaneously focusing a particle beam and an...

Combination apparatus having a scanning electron microscope ther

Combined electron microscope

Combined scanning electron and scanning tunnelling microscope ap

Combined scanning probe and scanning energy microscope

Compact scanning electron microscope

Compact temperature-compensated tube-type scanning probe with la

Compact temperature-compensated tube-type scanning probe with la

Compact, high collection efficiency scintillator for...

Compact, integrated electron beam imaging system

Compensation circuit for use in a high resolution amplified...