Coating thickness measuring device

Details Coating thickness measuring device Coating thickness measuring device

1981-04-27

1984-04-03

Willis, Davis L.

Radiant energy

Inspection of solids or liquids by charged particles

Including a radioactive source

G01N 2300

Patent

active

044410220

ABSTRACT:
A device especially adapted for measuring the thickness of coatings on small, complexly-shaped parts, such as, for example, electronic connectors, electronic contacts, or the like. The device includes a source of beta radiation and a radiation detector whereby backscatter of the radiation from the coated part can be detected and the thickness of the coating ascertained. The radiation source and detector are positioned in overlying relationship to the coated part and a microscope is provided to accurately position the device with respect to the part. Means are provided to control the rate of descent of the radiation source and radiation detector from its suspended position to its operating position and the resulting impact it makes with the coated part to thereby promote uniformity of readings from operator to operator, and also to avoid excessive impact with the part, thereby improving accuracy of measurement and eliminating damage to the parts.

REFERENCES:
patent: 4190770 (1980-02-01), Saunders et al.

Affiliated with

Also associated with

Rating

Coating thickness measuring device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Coating thickness measuring device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Coating thickness measuring device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-668958