Sample processing apparatus and method for removing charge...

Sample relocation method in charged particle beam apparatus...

Sample shape determination by measurement of surface slope with

Sample stage for scanning probe microscope head

Sample support prepared by semiconductor silicon process...

Sample support prepared by semiconductor silicon process...

Sample surface observation method

Sample surface structure measuring method

Sample table for pattern exposure machine

Sample tilting device in electron microscope

Sample transfer apparatus and sample stage

Sample transfer unit and sample transferring method

Sample-moving automatic analyzing apparatus

Sample-stage for scanning electron microscope

Sample-stand for scanning electron microscope

Samples for transmission electron microscopy

Sampling feedback system

Scan and tilt apparatus for an ion implanter

Scan data collection for better overall data accuracy

Scan data collection for better overall data accurancy