Calibration substrate and method for calibrating a...

Radiant energy – Inspection of solids or liquids by charged particles

Reexamination Certificate

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C250S307000, C250S310000, C250S492200, C250S492300

Reexamination Certificate

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07453063

ABSTRACT:
A calibration substrate for use during calibration of a lithographic apparatus is disclosed. The calibration substrate includes a first substantially flat surface, a second substantially flat surface that is substantially parallel to the first surface, and an edge that connects the first surface to the second surface. The calibration substrate has a thermal expansion coefficient of less than about 1.0×10−6K−1to reduce deformation thereof due to thermal changes in the substrate while in the lithographic apparatus.

REFERENCES:
patent: 5674650 (1997-10-01), Dirksen et al.
patent: 5969441 (1999-10-01), Loopstra et al.
patent: 6262796 (2001-07-01), Loopstra et al.
patent: 6710849 (2004-03-01), Kwan et al.
patent: 2007/0058152 (2007-03-01), Zaal et al.

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