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Arrangement for optically measuring the profile of a radiation r

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Arrangement for projecting a test pattern onto a surface to be i

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Arrangement for rapid depth measurement using lens focusing

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Arrangement for scanned 3-D measurement

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Arrangement for sensing the characteristics of a surface and det

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Arrangement for sensing the characteristics of a surface and det

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Arrangement for sensing the geometric characteristics of an obje

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Arrangement for sensing the geometric characteristics of an obje

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Arrangement for sensing the surface of an object independent of

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Arrangement for testing complex concave reflecting surfaces for

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Arrangement of eliminating erroneous data in three-dimensional o

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Array element examination method and array element examination d

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Aspects of producing, directing, conditioning, impinging and...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Aspects of producing, directing, conditioning, impinging and...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Assembly and method for monitoring the alignment of a workpiece

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Assembly and method for monitoring the alignment of a workpiece

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Assembly suitable for determining a surface topology of a workpi

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Atmospheric transmissometer

Optics: measuring and testing – By polarized light examination
Patent

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Auto polarized light removal

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Automated ellipsometer and the like systems

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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