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Wafer alignment sensor

Optics: measuring and testing – By polarized light examination – With light attenuation

Patent

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Wafer detection apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation

Patent

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Wavelength dispersion measuring apparatus and polarization dispe

Optics: measuring and testing – By polarized light examination

Patent

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Wavelength-dependent surface contour measurement system and...

Optics: measuring and testing – By polarized light examination – With light attenuation

Reexamination Certificate

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Wavelength-parallel polarization measurement systems and...

Optics: measuring and testing – By polarized light examination

Reexamination Certificate

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Weld-position detector provided with an optical axis adjustment

Optics: measuring and testing – By polarized light examination – With light attenuation

Patent

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Wheel profile sensor

Optics: measuring and testing – By polarized light examination – With light attenuation

Patent

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Wheelset sensing system

Optics: measuring and testing – By polarized light examination – With light attenuation

Patent

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Wheelset sensing system

Optics: measuring and testing – By polarized light examination – With light attenuation

Patent

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Wire bonding external appearance inspecting apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation

Patent

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Wiring pattern detection method and apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation

Patent

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Work piece butt position detecting method for butt welding

Optics: measuring and testing – By polarized light examination – With light attenuation

Patent

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Workpiece centering apparatus and method

Optics: measuring and testing – By polarized light examination – With light attenuation

Patent

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Workpiece having alignment marks for positioning a pattern at a

Optics: measuring and testing – By polarized light examination – With birefringent element

Patent

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