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Sample analysis method

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Sample entry purge system in spectrophotometer,...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Sample investigating system

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Sample orientation system and method

Optics: measuring and testing – By polarized light examination
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Sample orientation system and method

Optics: measuring and testing – By polarized light examination
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Sample point interferometer for measuring changes in figure of a

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Sample point interferometer having separate rigid body and figur

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Scale for measuring dimension of article and scale to be used in

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Scale for sensing moving object, and apparatus for sensing...

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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Scanning arrangement and method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Scanning arrangement and method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Scanning beam optical position determining apparatus and method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Scanning near-field optic/atomic force microscope

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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Scanning phase measuring method and system for an object at a vi

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Scanning system for three-dimensional object digitizing

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Scanning system for three-dimensional object digitizing

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Scattered-light laser microscope

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Scatterometry to simultaneously measure critical dimensions...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Scratch depth measuring instrument and method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Scribe mark reader

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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