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Easy to align interferometric reference reflectors

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Edge bead removal inspection by reflectometry

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Edge bead removal inspection by reflectometry

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Edge bead removal inspection by reflectometry

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Edge detector in optical measuring instrument

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Elastic-wave monitoring device and surface-acoustic-wave device

Optics: measuring and testing – By polarized light examination – With polariscopes
Reexamination Certificate

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Electric component monitoring device and electronic component mo

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Electric component observation system

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Electric field sensor

Optics: measuring and testing – By polarized light examination – With polariscopes
Reexamination Certificate

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Electro-optic device for continuously monitoring the relative po

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Electro-optical contour measuring system

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Electro-optical distance measuring apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Electro-optical gap and flushness sensors

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Electro-optical inspection

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Electro-optical inspection

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Electro-optical inspection

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Electro-optical method and apparatus for measuring the fit of ad

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Electro-optical position-monitoring apparatus with tracking dete

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Electro-optical scanner

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Electro-optical scanning system with self-adaptive scanning capa

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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