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Fast optical stokes polarimeter

Optics: measuring and testing – By polarized light examination – With polariscopes
Reexamination Certificate

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Fast sample height, AOI and POI alignment in mapping...

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Fiber optic displacement measuring apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Fiber optic displacement sensor

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Fiber optic probe and method for detecting optically active mate

Optics: measuring and testing – By polarized light examination
Patent

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Fiber polarimeter, the use thereof, as well as polarimetric...

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Fiber polarimeter, the use thereof, as well as polarimetric...

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Fiber polarimeter, the use thereof, as well as polarimetric...

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Field shift moire system

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Film measurement

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Film measurement

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Film measurement with interleaved laser cleaning

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Film thickness measuring apparatus

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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Film thickness measuring apparatus

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Filter for laser gaging system

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Fine movement mechanism unit and scanning probe microscope

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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Fine structure evaluation apparatus and method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Fine surface profile measuring apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Fixed-slit type photoelectric microscope

Optics: measuring and testing – By polarized light examination
Patent

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Flat sheet scatterometer

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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