Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1983-12-29
1987-02-03
Rosenberger, R. A.
Optics: measuring and testing
By polarized light examination
With light attenuation
G01B 1124
Patent
active
046406204
ABSTRACT:
A pattern of light is projected upon a surface to be measured which may be devoid of surface detail. A sharply focused image of the surface provides distance discrimination. Although the projected pattern may be separate from the imaging optics, a common optics path removes distortion, provides maximum sensitivity and eliminates processing for misalignment between projector and imager. Parallel detection of regions within the image receiving light intensities above a threshold enables rapid availability of measurements. Optical cross-correlation and Fourier transform processing methods may be employed to enhance image processing with no processing delay. Three-dimensional co-ordinate measurements relative to the sensor are reported for all in-focus regions of the image. Refocusing the lens provides depth coverage.
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Fogiel Max
Robotic Vision Systems Inc.
Rosenberger R. A.
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