Arrangement for projecting a test pattern onto a surface to be i

Details Arrangement for projecting a test pattern onto a surface to be i Arrangement for projecting a test pattern onto a surface to be i

1994-06-07

1996-02-20

Evans, F. L.

Optics: measuring and testing

By polarized light examination

With light attenuation

356371, G01B 1124

Patent

active

054934001

ABSTRACT:
An arrangement generates a projection beam path on the projection objective outside of the optical axis. This is achieved by mounting an optically transparent wedge forward or rearward of the test pattern. The wedge can be rotated with respect to its orientation by 180.degree..

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