Arrangement for scanned 3-D measurement

Details Arrangement for scanned 3-D measurement Arrangement for scanned 3-D measurement

1985-03-04

1987-02-17

Rosenberger, R. A.

Optics: measuring and testing

By polarized light examination

With light attenuation

356 1, 358 93, G01B 1124

Patent

active

046435786

ABSTRACT:
Three-dimensional surface measurements are made in the presence of interfering background light such as weld arc glare by scanning the surface with a narrow light beam and synchronously masking the image of the illuminated surface to block all light within the area of expected light returned by the surface from the scanned light beam. The masking is moved synchronously across the image area as the expected returned light follows the scanned path of the scanning light beam. Masking is accomplished mechanically or by electro-optic devices.

REFERENCES:
patent: 4168512 (1979-09-01), Ito et al.
patent: 4493968 (1985-01-01), Brown
patent: 4494874 (1985-01-01), DiMatteo et al.

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