Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1982-10-18
1985-07-16
Rosenberger, R. A.
Optics: measuring and testing
By polarized light examination
With light attenuation
356 1, G01B 1124
Patent
active
045293163
ABSTRACT:
An arrangement for eliminating erroneous data in three-dimensional optical sensors, in which a point on a surface is illuminated, and reflections from the point are received at a first location spaced from the source of illumination. The three-dimensional location of the point is computed as a function of the reflection that is received at the first location. The procedure of illuminating the point is repeated for obtaining reflections from the point at a second location which is spaced from the first location and the illuminating source. After computing the three-dimensional location of the point obtained from data dependent on the reflection at the second location, the computations relative to the first and second locations are compared. If the computations produce substantially identical results, the point is designated to be a true point on the surface. When, on the other hand, the results produced by the two computations differ substantially, then the point is designated to be a false point which does not lie on the surface.
REFERENCES:
patent: 2220427 (1940-11-01), Romanus
patent: 2249891 (1941-07-01), Ekman et al.
patent: 4202612 (1980-05-01), DiMatteo
patent: 4343553 (1982-08-01), Nakagawa et al.
patent: 4373804 (1983-02-01), Pryor et al.
patent: 4448532 (1984-05-01), Joseph et al.
Fogiel Max
Robotic Vision Systems Inc.
Rosenberger R. A.
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