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Selected: P

Parallel detecting, spectroscopic ellipsometers/polarimeters

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Parallelogram shaped optical retarder element for use in spectro

Optics: measuring and testing – By polarized light examination
Patent

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Parametric profiling using optical spectroscopic systems

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Parametric profiling using optical spectroscopic systems

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Particle path determination system

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Passive fiber optic sonar system

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Passive optical position measurement system

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Passive smoke plume opacity monitor

Optics: measuring and testing – By polarized light examination
Patent

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Patient positioning and monitoring system

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Pattern area ratio measuring apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Pattern optimization when measuring depth to a surface using len

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Pattern position detection apparatus using laser beam

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Pattern shift measuring method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Pattern shift measuring method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Pencil beam interferometer

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Performing retardation measurements

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Performing retardation measurements

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Performing retardation measurements

Optics: measuring and testing – By polarized light examination – With birefringent element
Reexamination Certificate

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Peripheral viewing optical scanner for three dimensional surface

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Peripheral viewing optical scanner for three dimensional surface

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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