Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1975-08-27
1979-11-27
Corbin, John K.
Optics: measuring and testing
By polarized light examination
With light attenuation
250558, 356 2, 356397, 356380, G01B 1100, G01C 1102, G01C 1112
Patent
active
041758625
ABSTRACT:
A plurality of projectors are positioned in spaced relationship about an object with a surface to be geometrically analyzed. The projectors have cooperating masks which project onto the object illuminated patterns that subdivide the object into predetermined sections. Each mask has a predetermined pattern of sections, and is applied in sequence. The masks are cooperatively advanced in the projectors, with a separate illuminating pattern prevailing on the object each time that the masks are advanced. The combinations of the patterns on the masks define closely-spaced sections subdividing the object. The patterns are coded so that each section is uniquely defined in coded form. Cameras having the entire object within their field of view, photograph the object each time a separate mask is applied.
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Kamiya, R., "The Digital Photo Map", Photogrammetric Engineering, vol. 39, 1972, pp. 985-988.
DiMatteo Paul L.
Ross Joseph A.
Stern Howard K.
Corbin John K.
Fogiel Max
Punter Wm. H.
Solid Photography Inc.
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