Arrangement for sensing the geometric characteristics of an obje

Details Arrangement for sensing the geometric characteristics of an obje Arrangement for sensing the geometric characteristics of an obje

1979-06-01

1985-04-16

Punter, William H.

Optics: measuring and testing

By polarized light examination

With light attenuation

G01B 1100, G01C 1104

Patent

active

045112525

ABSTRACT:
A plurality of projectors are positioned in spaced relationship about an object with a surface to be geometrically analyzed. The projectors have cooperating masks which project onto the object illuminated patterns that subdivide the object into predetermined sections. Each mask has a predetermined pattern of sections, and is applied in sequence. The masks are cooperatively advanced in the projectors, with a separate illuminating pattern prevailing on the object each time that the masks are advanced. The combinations of the patterns on the masks define closely-spaced sections subdividing the object. The patterns are coded so that each section is uniquely defined in coded form. Cameras having the entire object within their field of view, photograph the object each time a separate mask is applied.

REFERENCES:
patent: 2484103 (1949-10-01), Lewis
patent: 3234863 (1966-02-01), Peterson et al.
patent: 3619065 (1971-11-01), Falconbridge
patent: 3735036 (1973-05-01), Macovski
patent: 3832693 (1974-08-01), Ishizaki et al.
patent: 3866052 (1975-02-01), Di Matteo et al.
patent: 4175862 (1979-11-01), Di Matteo et al.
Anuta et al., "Map Matching System", IBM Tech. Disc. Bull., 10-1964, pp. 372-373.
Altenhofen-Hedden, "Transformation & Rectification", Chapt. 26 of Manual of Photogrammetry, 3rd Edition 1966, American Soc. of Photogrammetry, pp. 846-849.

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