Arrangement for sensing the characteristics of a surface and det

Details Arrangement for sensing the characteristics of a surface and det Arrangement for sensing the characteristics of a surface and det

1979-06-01

1985-04-02

Punter, William H.

Optics: measuring and testing

By polarized light examination

With light attenuation

356376, 356389, 356397, G01B 1124, G01C 1102, G01B 1100

Patent

active

045084521

ABSTRACT:
The surface to be sensed or scanned is placed in the path of a projector which is moved along an axis of the surface. The path of motion of the projector is subdivided into predetermined sections which are illuminated by the projector in accordance with a predetermined sequential pattern. This procedure of moving the projector is repeated a predetermined number of times, with a separate illuminating pattern prevailing each time that the projector is moved relative to the surface and traverses the entire surface to be scanned. The combinations of the patterns obtained from the repeated scannings of the projector define closely-spaced sections of the surface. The patterns are coded so that each section is uniquely defined in coded form. A camera having the entire surface within its field of view photographs the surface each time that the projector is moved along the axis of the surface.

REFERENCES:
patent: 3040620 (1962-06-01), Ferris
patent: 3234863 (1966-02-01), Peterson et al.
patent: 3619065 (1971-11-01), Falconbridge
patent: 3735036 (1973-05-01), Macovski
patent: 3832693 (1974-08-01), Ishizaki et al.
patent: 3866052 (1975-02-01), DiMatteo et al.
patent: 3876303 (1975-04-01), Talts
patent: 4185918 (1980-01-01), DiMatteo et al.
Anuta et al., "Map Matching System", IBM Tech. Disc. Bull., 10-1964, pp. 372-373.
Altenhofen-Hedden, "Transformation & Rectification", Chapt. 26 of Manual of Photogrammetry, 3rd Edition, 1966, American Soc. of Photogrammetry, pp. 846-849.

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