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Optical monitor for direct thickness control of transparent film

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Optical monitor for measuring a gap between two rollers

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Optical monitoring of growth and etch rate of materials

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Optical part inspection system

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Optical reticle inspection system and method

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Optical stress generator and detector

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Optical stress generator and detector

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Optical stress generator and detector

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Optical sub-pixel parts inspection system

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Optical system for measuring and inspecting partially transparen

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Optical technique for rapid inspection of via underetch and cont

Optics: measuring and testing – By configuration comparison – With object being compared and light beam moved relative to...
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Optical thickness measuring apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Optically testing the lateral dimensions of a pattern

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Optically testing the lateral dimensions of a pattern

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Opto-electronic measuring apparatus for checking linear dimensio

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Optoelectronic comparison apparatus for structures on plane surf

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Optoelectronic sensor

Optics: measuring and testing – By configuration comparison
Patent

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Particle detection on patterned wafers and the like

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Parts mounting inspection method

Optics: measuring and testing – By configuration comparison – With object being compared and light beam moved relative to...
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Parts recognizing device for mounting machine

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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