Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent
1993-04-19
1995-01-17
Evans, F. L.
Optics: measuring and testing
By configuration comparison
With photosensitive film or plate
250560, 356385, G01B 1104, G01B 1110
Patent
active
053830210
ABSTRACT:
A non-contact inspection system capable of evaluating spatial form parameters of a workpiece to provide 100% inspection of parts in production. The system causes parts to be sequentially loaded onto an inclined track where they pass through a test section. The test section includes a length detection array for measuring the length of the workpiece, which includes a source generating a sheet of light oriented in the longitudinal direction of the workpiece. The profile of the parts are evaluated by one or more light sources also creating a sheet of light oriented transversed to the longitudinal axis of the parts. Single channel photodetectors are provided for each of the sources which provides an analog output of the extent to which each sheet of light is occluded by the part. These outputs are analyzed through appropriate signal processing hardware and software to generate length and profile data related to the workpiece geometry.
REFERENCES:
patent: 2812685 (1957-11-01), Vossberg
patent: 3724958 (1973-04-01), Callan
patent: 4067652 (1978-01-01), Bohlander
patent: 4122525 (1978-10-01), Eaton
patent: 4260260 (1981-04-01), Letort et al.
patent: 4395119 (1983-07-01), Nakata et al.
patent: 4476533 (1984-10-01), Daudt et al.
patent: 4532723 (1985-08-01), Kellie et al.
patent: 4576482 (1986-03-01), Pryor
patent: 4676648 (1987-06-01), Schulz et al.
patent: 4875777 (1989-10-01), Harding
patent: 4880991 (1989-11-01), Boehnlein et al.
patent: 4914307 (1990-04-01), Kanev
patent: 4978223 (1990-12-01), Kutchenriter et al.
patent: 4991308 (1991-02-01), Donaldson
patent: 5164995 (1992-11-01), Brooks et al.
Evans F. L.
Mectron Engineering Company
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