Optics: measuring and testing – By configuration comparison
Patent
1998-04-29
2000-02-08
Kim, Robert H.
Optics: measuring and testing
By configuration comparison
356390, 356392, G01B 1100, G01B 908
Patent
active
060233354
ABSTRACT:
The invention relates to an optoelectronic sensor comprising a light transmitter for the transmission of light signals into a monitored region, and also a light receiver for the reception of light signals transmitted by the light transmitter, wherein an evaluation circuit which is directly or indirectly acted on by the light receiver is provided for the production of an article detection signal in the case when an object is present in the monitored region. The light receiver is formed as a spatially resolving receiver element for the determination of the position of the center of intensity of the received light in the region of the light sensitive area of the receiver element. A memory element which co-operates with the evaluation circuit is provided for the storage of at least desired position of the center of intensity of the received light. In addition, the evaluation circuit has means for the comparison of the actual positions found during the operation of the sensor with the stored desired position, whereby an article detection signal can be produced for the case in which the deviation of the actual position from the desired position exceeds a defined threshold value.
REFERENCES:
patent: 5504569 (1996-04-01), Kato et al.
patent: 5629704 (1997-05-01), Throngnumchai
"Sehen und gesehen werden", in: Konstruktionspraxis, No. 2, Feb. 1996, 7. Jg. p. 88.
"Dreimal weiter, Neue ASI-Komponenten mit dreifacher Reichweite fur die Prozessebene", in: Flexible automation Jan. 1996, p. 34.
GIT, Sicherheit & Management, Feb. 1995, p. 98.
Kim Robert H.
Punnoose Roy M.
Sick AG
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