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Method and apparatus for bending an elongate workpiece

Optics: measuring and testing – By configuration comparison – With object being compared and light beam moved relative to...
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Method and apparatus for checking a predetermined monitoring are

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method and apparatus for checking the width and parallelism of m

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method and apparatus for checking the width and parallelism of m

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method and apparatus for CMP end point detection using...

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Method and apparatus for controlling thickness of a layer of an

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method and apparatus for detecting a circuit pattern

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method and apparatus for detecting defects in the...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Method and apparatus for detecting defects in the...

Optics: measuring and testing – By configuration comparison – With projection on viewing screen
Reexamination Certificate

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Method and apparatus for detecting flaw on threads of male screw

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method and apparatus for detecting obstructed vacuum nozzles

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method and apparatus for detecting process sensitivity to integr

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method and apparatus for detecting the endpoint in chemical-mech

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method and apparatus for detecting the endpoint in chemical-mech

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method and apparatus for detection of charge on ions and...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Method and apparatus for detection of undesirable surface deform

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method and apparatus for determining position of points on artic

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method and apparatus for determining the degree of oxidation of

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method and apparatus for determining thickness of an OPC layer o

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method and apparatus for evaluating the thickness of thin films

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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