Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1995-03-30
1999-05-11
Pham, Hoa Q.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356376, 356 401, 250221, 25055922, G01B11/24
Patent
active
059033550
ABSTRACT:
Method for checking a predetermined monitoring area, wherein at least one distance sensor provided in particular in the edge region of the monitored area, which transmits a scanning beam which sweeps over the monitored area in a predetermined scanning movement and thereby changes its direction, which receives the scanning beam which is reflected at boundaries of the monitored area and/or at objects located in the monitored area, and which determines a distance signal representative of the distance of the point of reflection of the scanning beam from the distance sensor and also a direction signal representing the direction of the scanning beam. The distance signals and the direction signals found during the scanning movement define a distance contour function, and an evaluation unit connected to the distance sensor compares the distance contour function which has been found with at least one stored reference contour function representing an expected object contour. Moreover, the evaluation unit generates an output signal, providing the distance contour function which has been found and the reference contour function correspond, or do not correspond, within preset tolerance limits.
REFERENCES:
patent: 4627734 (1986-12-01), Rioux
patent: 4749273 (1988-06-01), Reinhold
patent: 4838696 (1989-06-01), Pryor
Biehl, K.E., et al. (1988) "Ultrasonic sensor systems for industrial object detection and object classification", Technisches Messen, vol. 55(10):367-376.
JP 60-89784 A. In: Patents Abstracts of Japan, P-390, Sep. 21, 1985, vol. 9, No. 236.
Erwin Sick GmbH - Optik-Elektronik
Pham Hoa Q.
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