Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent
1989-09-06
1990-09-18
Evans, F. L.
Optics: measuring and testing
By configuration comparison
With photosensitive film or plate
G01B 1102
Patent
active
049573705
ABSTRACT:
A method and apparatus determines the thickness of a copper oxide coating of an object by measuring the quantity of light reflected from the object in at least two wavelength zones, and then determining a value for a relationship between those quantities, for example, the ratio or difference of those quantities. The value is then compared to a predetermined, regular correspondence between such values and copper oxide thicknesses to determine the object's copper oxide thickness.
REFERENCES:
patent: 3017512 (1962-01-01), Wolbert
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patent: 4095881 (1978-06-01), Maddox
patent: 4405989 (1983-09-01), Tsukada et al.
"Three Color Cases Interferometer", Edwards, IBM Technical Disclosure Bulletin, vol. 16, #2, 7/1973.
L. Mori et al., "An Absolute Method of Color Temperature Measurement", Acta Chromatica, vol. 1, No. 3, pp. 93-102 (Oct., 1984).
ASTM T29-78 Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications (May, 1978).
Akiyama Jun-etsu
Mori Leo
Tominaga Mamoru
Evans F. L.
Kabushiki Kaisha Toshiba
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