Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1978-11-03
1981-07-07
Corbin, John K.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
250561, 356375, G01B 1100, G01B 1114
Patent
active
042771765
ABSTRACT:
A method and apparatus for checking the width and parallelism of margins following the centering of a print with respect to a support, wherein the support is moved in front of opto-electronic reading devices such that the margins extend parallel to the direction of movement. A number n of photosensitive member are distributed in a linear manner transversely with respect to the direction of movement of the support, the number of sensitized photosensitive members of the reading devices producing a signal greater than a threshold level is counted for each margin, the number of members counted is compared with a reference value, and the difference between the numbers of members counted at two different points of each margin is compared with a reference value. The first comparison provides a measure of the width of the margin, and the second comparison provides a measure of the parallelism of the margins.
REFERENCES:
patent: 2840722 (1958-06-01), Frommer
patent: 3883816 (1974-09-01), Emura et al.
Adams Bruce L.
Burns Robert E.
Compagnie Industrielle Radioelectrique
Corbin John K.
Lobato Emmanuel J.
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