Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1987-05-18
1988-12-20
Rosenberger, R. A.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356237, 382 22, G01B 1124, G06K 900
Patent
active
047922320
ABSTRACT:
A method and apparatus for the detection of undesirable surface deformities is disclosed wherein a known (linear) light pattern is reflected off a fabricated part having a nominally smooth surface, the reflected light pattern subsequently being analyzed for distortions from the expected light pattern. The extent of the detected distortions may be quantified by the use of a computer having appropriate software, in order to identify and quantify unacceptable surface deformities.
REFERENCES:
patent: 4110736 (1978-08-01), Kono
patent: 4525858 (1985-06-01), Cline et al.
patent: 4598420 (1956-07-01), Harvey
patent: 4629319 (1986-12-01), Clarke et al.
Jobe John D.
Lepley Allen E.
Douglas Paul I.
Rosenberger R. A.
Shell Oil Company
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