Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1981-01-14
1983-01-04
Punter, William H.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
250561, 356375, G01B 1100, G01B 1114
Patent
active
043670458
ABSTRACT:
A method and apparatus for checking the width and parallelism of margins following the centering of a print with respect to a support. The support is moved in front of two opto-electronic reading devices with the margins to be checked arranged transversely with respect to the direction of movement of the support. The reading devices are used to produce two counting periods for each margin, the widths of the periods corresponding to the widths of the margin at two points thereof. Clock pulses are produced depending on the movement of the support by means of an opto-electronic detector. Clock pulses appearing in the counting periods are counted and the resultant count compared with maximum and minimum reference values to check the width of the margins. Clock pulses appearing in one of the counting periods are counted only when the counting periods do not coincide with regard to time and the number of pulses counted is compared with a reference value representing the tolerance limit of non-parallelism.
REFERENCES:
patent: 2220736 (1940-11-01), Stockbarger et al.
patent: 2840722 (1958-06-01), Frommer
patent: 3412993 (1968-11-01), Giorgi
patent: 3833816 (1974-09-01), Emura et al.
patent: 4063820 (1977-12-01), Borgese
Adams Bruce L.
Burns Robert E.
Compagnie Industrielle Radioelectrique
Lobato Emmanuel J.
Punter William H.
LandOfFree
Method and apparatus for checking the width and parallelism of m does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for checking the width and parallelism of m, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for checking the width and parallelism of m will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1580713