Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1992-03-04
1994-07-19
Evans, F. L.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356237, 382 8, G01N 2188, G01B 700
Patent
active
053314077
ABSTRACT:
A method and apparatus for detecting a circuit pattern comprise a stage for mounting an object under inspection having a circuit pattern to be detected, means of generating a signal in response to the amount of movement of the stage, a detection optical system for detecting the circuit pattern, an opto-electric transducer which receives the image of the pattern provided by the detection optical system and transforms the image into an image signal, means of calculating the amount of expansion or contraction of the object by detecting the distance between specific patterns on the object, and drive control means which produces a clock signal for the opto-electric transducer based on the stage movement signal provided by the signal generation means and varies the clock signal so as to vary the dimension of the detected image arbitrarily.
REFERENCES:
patent: 4012147 (1977-03-01), Walrafen
patent: 4559603 (1985-12-01), Yoshikawa et al.
patent: 4628531 (1986-12-01), Okamoto et al.
patent: 4993834 (1991-02-01), Carlhoff et al.
Doi Hideaki
Hara Yasuhiko
Karasaki Koichi
Evans F. L.
Hitachi , Ltd.
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