System for inspecting pin grid arrays

Details System for inspecting pin grid arrays System for inspecting pin grid arrays

1995-05-18

1997-07-15

Pham, Hoa Q.

Optics: measuring and testing

By configuration comparison

With comparison to master, desired shape, or reference voltage

356237, 382146, 348126, G01B 1100

Patent

active

056488530

ABSTRACT:
An arrangement for inspecting straightness of an array of pins in which the array is illuminated by a thin beam of light. Images of surfaces of the array of pins that are illuminated are projected on a photo-sensitive device. The array of pins is movable relative to the beam of light and the imaging device. The imaging device and photo-sensitive device are also movable relative to the array of pins.

REFERENCES:
patent: 4553843 (1985-11-01), Langley et al.
patent: 4696047 (1987-09-01), Christian et al.
patent: 4772125 (1988-09-01), Yoshimura et al.
patent: 4821157 (1989-04-01), Birk et al.
patent: 4875778 (1989-10-01), Luebbe et al.
patent: 4978224 (1990-12-01), Kishimoto et al.
patent: 5208463 (1993-05-01), Honma et al.
patent: 5274434 (1993-12-01), Morioka et al.
patent: 5309223 (1994-05-01), Konicek et al.

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