System for testing a pattern recorded on a plate

Details System for testing a pattern recorded on a plate System for testing a pattern recorded on a plate

1979-03-20

1980-09-09

Corbin, John K.

Optics: measuring and testing

By configuration comparison

With comparison to master, desired shape, or reference voltage

G01B 1100, G06K 710

Patent

active

042214874

ABSTRACT:
A system for testing a pattern recorded on a plate with a high density in relation to a reference pattern, comprising means for analyzing the pattern with a line detector and a logic circuit for processing the data supplied by the detector and data relating to the reference pattern, the two patterns being described line-by-line. The logic circuit is intended to detect the errors while admitting for each line a shift between the two patterns of one unit in a direction X or in a direction Y perpendicular to X, the maximum shift allowed for the entire pattern amounting, for example, to three units in each direction.

REFERENCES:
patent: 3753617 (1973-08-01), Ehrat
patent: 3944369 (1976-03-01), Cuthbert et al.
patent: 4139779 (1979-02-01), Ehrat
patent: 4166541 (1979-09-01), Smith

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