Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1998-03-03
1999-04-20
Font, Frank G.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356445, 356435, 356309, G01B 1100
Patent
active
058962018
ABSTRACT:
An optical device for wavelength monitoring and wavelength control. The optical device has an optical element having a first surface and a second surface not parallel to each other. The optical element separates a light beam supplied to the first surface into a first beam reflected on the first surface, a second beam passed through the first surface, reflected on the second surface, and passed through the first surface again, and a third beam passed through the first surface and the second surface in this order. An optical filter is provided so as to transmit the first and second beams. The optical filter has wavelength characteristics different according to an incidence angle. The first and second beams passed through the optical filter are supplied to first and second photodetectors, respectively. On the basis of such a difference in wavelength characteristic, the wavelength of the light beam can be monitored according to outputs from the first and second photodetectors.
REFERENCES:
patent: 4074939 (1978-02-01), Rabi
patent: 4095098 (1978-06-01), Looper
Font Frank G.
Fujitsu Limited
Ratliff Reginald A.
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