Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1996-08-27
1998-06-30
Font, Frank G.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356 39, G01B 1100, G01M 3348
Patent
active
057742235
ABSTRACT:
An optical measuring method and an optical measuring apparatus are capable of obtaining the true mean time delay of a light waveform within a short time for the purpose of obtaining information on the internal structure of an object. Calculations include a first mean time delay when the light path includes the object, a second mean time delay when the light path does not include the object, and a subtraction of the second mean time delay from the first mean time delay to obtain a true mean time delay.
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Miwa Mitsuharu
Tsuchiya Yutaka
Urakami Tsuneyuki
Yamashita Yutaka
Font Frank G.
Hamamatsu Photonics K.K.
Stafira Michael P.
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