Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate
2007-10-16
2007-10-16
Nguyen, Sang H. (Department: 2886)
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
C356S237200, C250S559080
Reexamination Certificate
active
11057590
ABSTRACT:
Optical device for representing a central image (10) of an object (1) and at least one lateral image (11, 12, 13, 14) of the same object (1), with the length of the real optical path of said central image (10) being different from the length of the real optical path of said at least one lateral image (11, 12, 13, 14) and the length of the apparent optical path of said central image (10) being equal to the length of the apparent optical path of said at least one lateral image (11, 12, 13, 14), and module for the optical inspection of objects comprising such an optical device and an optical system (7) allowing a central image (10) of the object (1) and at least one lateral image (11, 12, 13, 14) of this same object (1) to be captured simultaneously. The apparent optical paths of the central image (10) and of the lateral image (11, 12, 13, 14) being identical, these two images can be captured and correctly focussed simultaneously by a same viewing system (7).
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Ismeca Semiconductor Holding SA
Nguyen Sang H.
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