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Path test signal generator and checker for use in a digital tran

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Pattern and method of metal line package level test for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Pattern data inspection method and storage medium

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Pattern data transfer circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Pattern detection for computer segments

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique
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Pattern generating apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Pattern generating method, pattern generator using the...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Pattern generator and electric part testing apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Pattern generator and memory testing device using the same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Pattern generator and test apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Pattern generator for a semiconductor integrated circuit tester

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Pattern generator for memory burn-in and test

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Pattern generator for semiconductor test system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Pattern generator for semiconductor test system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Pattern generator for semiconductor test system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Pattern generator for use in a semiconductor test device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Pattern matching to validate and classify computer variables...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Pausing a transfer of data

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error count or rate
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PBA recovery apparatus and method for interleaved reed-solomon c

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Patent

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PC and ATE integrated chip test equipment

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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