Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent
1998-05-21
2000-11-14
Cady, Albert De
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
G11C 2900
Patent
active
061484245
ABSTRACT:
A pattern generating apparatus used in quality judgment testing of memories incorporating a predetermined signal transfer configuration such as a protocol transfer system, the apparatus having: an address generating device for sequentially generating address patterns for specifying storage regions in a test memory; a first control device for converting the sequentially generated address patterns into a signal transfer configuration for the test memory and supplying these to the test memory to sequentially access the storage regions specified by the respective address patterns; and a second control device for determining a condition in which the test memory is operated with respect to the address pattern generated by the address generating device, and controlling a generation timing for the address pattern based on this.
REFERENCES:
patent: 4300234 (1981-11-01), Maruyama et al.
patent: 4402081 (1983-08-01), Ichimiya et al.
patent: 4759021 (1988-07-01), Kawaguchi et al.
patent: 5265102 (1993-11-01), Saito
patent: 5473616 (1995-12-01), Tsutsui et al.
patent: 5615218 (1997-03-01), Tsurumi
patent: 5856985 (1999-01-01), Fujisaki
patent: 5883905 (1999-03-01), Eastburn
patent: 5970073 (1999-10-01), Masuda et al.
Ando Electric Co. Ltd.
Cady Albert De
Chase Shelly A
LandOfFree
Pattern generating apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Pattern generating apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Pattern generating apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2076280