Circuit and method for testing a circuit having memory array...
Circuit and method for testing a data memory
Circuit and method for testing an integrated circuit
Circuit and method for testing an integrated circuit
Circuit and method for testing an integrated circuit
Circuit and method for testing embedded DRAM circuits...
Circuit and method for testing embedded phase-locked loop...
Circuit and method for testing high speed data circuits
Circuit and method for testing physical layer functions of a...
Circuit and method for testing semiconductor device
Circuit and method for time-efficient memory repair
Circuit and method for varying a pulse width of an internal...
Circuit and method providing dynamic scan chain partitioning
Circuit and method to prevent inadvertent test mode entry
Circuit and method to prevent inadvertent test mode entry
Circuit and method to prevent inadvertent test mode entry
Circuit and method, for storing data prior to and after...
Circuit and signal encoding method for reducing the number...
Circuit and/or method for automated use of unallocated...
Circuit apparatus and method for testing integrated circuits...