Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2007-01-30
2007-01-30
Kerveros, James C (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S733000
Reexamination Certificate
active
10241032
ABSTRACT:
A circuit and method for testing an eDRAM through a test controller with direct access (DA) mode logic is provided. The circuit and method of the present invention allows the testing of eDRAMs with a conventional memory tester. The present invention provides a semiconductor device including an embedded dynamic random access memory (eDRAM) for storing data, the eDram including a plurality of memory cells, and a test controller for testing the plurality of memory cells to determine if the cells are defective, the test controller including built-in self-test (BIST) logic circuitry for performing tests and for interfacing to a logic tester, and direct access mode logic circuitry for interfacing the eDRAM with an external memory tester. The test controller further comprises a multiplexer for multiplexing data, commands, and addresses from the BIST logic circuitry and the direct access mode logic circuitry to the eDRAM.
REFERENCES:
patent: 4481627 (1984-11-01), Beauchesne et al.
patent: 6044481 (2000-03-01), Kornachuk et al.
patent: 6286115 (2001-09-01), Stubbs
patent: 6496947 (2002-12-01), Schwarz
patent: 6668347 (2003-12-01), Babella et al.
patent: 6901542 (2005-05-01), Bartenstein et al.
patent: 2001/0003051 (2001-06-01), Yoshizawa
patent: 0480421 (1992-04-01), None
patent: WO0101422 (2001-01-01), None
PCT International Search Report.
Infineon - Technologies AG
Kerveros James C
Slater & Matsil L.L.P.
LandOfFree
Circuit and method for testing embedded DRAM circuits... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Circuit and method for testing embedded DRAM circuits..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Circuit and method for testing embedded DRAM circuits... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3781518