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Semiconductor integrated circuit with full-speed data...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit with local monitor circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit with memory redundancy circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit with memory redundancy circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
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Semiconductor integrated circuit with test circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit with test circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit with test device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Semiconductor integrated circuit, and designing method and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit, and semiconductor system...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique
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Semiconductor integrated circuit, and semiconductor system...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique
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Semiconductor integrated circuit, design support software...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit, method for designing the...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuits and efficient parallel...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor LSI circuit with scan circuit, scan circuit...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Semiconductor memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Semiconductor memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Semiconductor memory apparatus capable of detecting error in...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique
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