Semiconductor memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C714S769000

Reexamination Certificate

active

07877667

ABSTRACT:
In order to correct an error in input data to thereby obtain write data, in a memory core, an EXOR element performs arithmetic processing based on an output result of an output data latch for latching read data and a result of inputted array input data, and a selector selects a result of the arithmetic processing to prepare write data. Thus, data obtained after performance of the arithmetic processing can be generated in a semiconductor memory by an operation performed immediately after data read. In addition, it is unnecessary to transfer data to an external logic circuit. Therefore, the result of the arithmetic processing can be written to a memory cell block in a subsequent clock.

REFERENCES:
patent: 5864568 (1999-01-01), Nemazie
patent: 6047397 (2000-04-01), Mons
patent: 6243845 (2001-06-01), Tsukamizu et al.
patent: 6363511 (2002-03-01), Massoudi
patent: 6907559 (2005-06-01), Hall et al.
patent: 7761770 (2010-07-01), Larsen et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor memory does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor memory, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor memory will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2688101

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.