Scanning memory device and error correction method
Self resetting high speed redundancy circuit and method thereof
Self-diagnosable semiconductor memory device having a redundant
Semiconductor device and program data redundancy method...
Semiconductor device having a sense amplifier array with...
Semiconductor device test apparatus and method
Semiconductor integrated circuit and redundancy method thereof
Semiconductor integrated circuit and test method thereof
Semiconductor integrated circuit and the same checking method
Semiconductor integrated circuit device for display controller
Semiconductor integrated circuit device having fail-safe...
Semiconductor integrated circuit device including...
Semiconductor integrated circuit including memory macro
Semiconductor integrated circuit including memory macro
Semiconductor integrated circuit with memory redundancy circuit
Semiconductor memory device allowing repair of a defective memor
Semiconductor memory device and method of testing same
Semiconductor memory device and redundant address selection meth
Semiconductor memory device and semiconductor memory device...
Semiconductor memory device storing repair information...