Semiconductor integrated circuit and test method thereof

Details Semiconductor integrated circuit and test method thereof Semiconductor integrated circuit and test method thereof

2006-12-26

2006-12-26

Britt, Cynthia (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Replacement of memory spare location, portion, or segment

C714S723000, C365S201000

Reexamination Certificate

active

07155643

ABSTRACT:
A semiconductor integrated circuit includes a memory which has redundant lines for repair in both a column direction and a row direction. A test pattern generating section generates a specific test pattern for the memory. A comparing section reads an output from the memory to judge whether or not a fault cell exists in the memory and outputs a signal which shows existence or nonexistence of a faulty cell. The circuit includes a first data storage section, which operates in a first test mode for a test of the memory and a second test mode for a scan test, and a second data storage section which receives an output signal of the comparing section to store a state of presence or absence of a failure corresponding to the existence or nonexistence of the faulty cell. A repair judging section receives an input to the first data storage section and an output of retained contents in the first data storage section and judges that the memory is repairable. When the second data storage section is in a state where the failure exists, the first data storage section holds the data retained in the first data storage section.

REFERENCES:
patent: 5808947 (1998-09-01), McClure
patent: 6421286 (2002-07-01), Ohtani et al.
patent: 2002/0006065 (2002-01-01), Suzuki
patent: 200143698 (2001-02-01), None
patent: 200232998 (2002-01-01), None

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