Memory circuit and method for reading out data
Memory circuit being capable of compression test
Memory circuit having a controllable output drive
Memory circuit having a controllable output drive
Memory circuit having parity cell array
Memory circuit scan arrangement
Memory circuit testing system, semiconductor device, and...
Memory control circuit
Memory controller with a self-test function, and method of...
Memory data path circuit
Memory data verify operation
Memory device and input signal control method of a memory...
Memory device and method for redundancy/self-repair
Memory device capable of detecting its failure
Memory device test system and method
Memory device testing apparatus and data selection circuit
Memory device testing system and method having real time...
Memory device with comparison units to check functionality...
Memory devices operable in both a normal and a test mode and met
Memory devices with selectively enabled output circuits for...